Secondary Ion Mass Spectroscopy Workshop

UWS Innovation has great pleasure in inviting you to the 2^nd UWS Secondary Ion Mass Spectroscopy Workshop.

UWS’s world class SIMS research facility houses the only instrument of its kind on the east coast of Australia, and we are excited to see that the University’s substantial investment in upgrading this cutting edge equipment has benefited both researchers and Industry. The SIMS provides high-sensitivity trace element depth profiling and secondary ion microscopy imaging.

The Secondary Ion Mass Spectrometer is a valuable analytical tool that has can be used in many areas of research including:

·         Semiconductor devices

·         Energy conversion components

·         Materials science

·         Geology

·         Biological materials that can sustain ultra high vacuum

We invite both existing users and those wishing to expand their research to join us for the 2014 SIMS Workshop, which will give you the chance to learn more about Secondary Ion Mass Spectroscopy, tour the facility and hear presentations by SIMS users.

The 2014 SIMS workshop will include presentations by:

 

Dr Rong Liu	UWS SIMS Operator
Dr Philip Tanner	Research Fellow, Queensland Microtechnology Facility
Dr John Denman	ToF-SIMS Technologist, University of South Australia
Mr James Sharp	UWA PhD Student

Attendance is free and includes lunch and refreshments

RSVP – 20^th June 2014 to Victoria Hirst on 02 9685 9742 or v.hirst@uws.edu.au