Showing posts with label Secondary Ion Mass Spectrometry. Show all posts
Showing posts with label Secondary Ion Mass Spectrometry. Show all posts

Monday, November 14, 2011

2011 UWS SIMS Workshop

Image: Attendees at the 2011 UWS SIMS Workshop













The UWS SIMS (Secondary Ion Mass Spectrometry) Workshop was hosted at the Hawkesbury Institute for the Environment on 2 November 2011. The workshop brought together researchers and industry representatives interested in the highly specialised analytical capabilities offered by the UWS SIMS. The UWS Solar Research Facility at Hawkesbury houses the only SIMS instrument of its kind on the east coast of Australia.

Case studies were presented by current users of the instrument and included Prof Raman Singh from Monash University, Dr Jisheng Han from Griffith University and Dr Gerry Triani and Dr Peter Evans from the Australian Nuclear Science & Technology Organisation (ANSTO). All presentations gave the audience insight into practical applications of the instrument and demonstrated its sensitivity in elemental and isotopic surface analysis.

The workshop was well received by all in attendance, with vibrant discussions and networking opportunities. Attendees from Monash, ANU, UNSW, National Measurements Institute, Bluescope Steel, Silanna and Bluglass found the day stimulating and relevant to their research goals. A tour of the SIMS facility was given by the operator Dr David Nelson after the workshop, with many people indicating their desire to utilise the cutting edge equipment’s capabilities.

Used in semiconductor R&D, materials and nuclear sciences as well as environmental applications, the instrument is available to both researchers and industry. For more information, please refer to our website or contact us on 02 9685 9742 or at r.burnside@uws.edu.au

Tuesday, October 11, 2011

UWS Secondary Ion Mass Spectrometry Workshop

UWS will host the Secondary Ion Mass Spectrometry Workshop. UWS’s Secondary Ion Mass Spectrometer (SIMS) research facility houses the only instrument of its kind on the east coast of Australia. The University’s substantial investment in upgrading this equipment has now been completed. The SIMS is one of the most effective surface analysis instruments for advanced material research. Used in semiconductor R&D, materials and nuclear sciences as well as environmental applications, the SIMS provides high-sensitivity trace element depth profiling and secondary ion microscopy imaging.

UWS plans to expand its collaborative research efforts with both other research institutions and industry.

We invite both existing users and others wishing to enhance their research to attend.

Details:
Wednesday, 2 November 2011
9.30am to 2.30pm
UWS Hawkesbury Campus, Cnr Bourke St and Londonderry Rd, Richmond NSW 2753

If you would like more information on the workshop or the instrument, please contact Robert Burnside on 02 9685 9742 or at r.burnside@uws.edu.au